Nanobeam Diffraction and 4D-STEM Analysis of Crystalline and Disordered Materials¶
Instructors
Colin Ophus Stanford University
Stephanie Ribet Lawrence Berkeley National Laboratory
Ian MacLaren University of Glasgow
Companion site for Short Course X11 at Microscopy & Microanalysis 2026, Sunday, August 2, 2026, Room S202 B, Baird Center, Milwaukee, WI. This site collects the 2026 agenda, teaching material for each module, hands-on Google Colab tutorials, and references for further reading.
What this course covers¶
Practical guidance for acquiring nanobeam diffraction data, including probe conditions, signal-to-noise, and camera parameters
Loading, organizing, and calibrating 4D-STEM data across formats, with tools for disk detection, preprocessing, and ML-based analysis
Virtual imaging approaches: bright/dark field reconstructions, digital dark field, and phase/domain mapping
Diffraction analysis of crystalline samples: strain mapping, orientation mapping, and phase identification
Diffraction analysis of disordered or semicrystalline materials: polymer orientation, phase mapping, and pair distribution functions
Use the sidebar (or the agenda) to jump to the module pages. Each has teaching notes, the hands-on Colab tutorial, and references for further reading.